Materials Library Visualization

"E<sub>g</sub>" "IsCalculated" "ReferenceId" "Comment" "Temperature" "CrystalSystem" "Modification" "0.47" "0" "45" "T < 300 K" "" "" "" "0.7" "0" "45" "" "" "" "" "1.4" "0" "45" "" "" "" "" "1.6" "0" "45" "" "" "" "" "1.9" "0" "45" "" "" "" "" "1.971" "0" "45" "" "77" "" "" "1" "0" "37" "" "300" "" "" "1.2" "0" "30" "" "300" "" "" "1.5" "0" "845" "UV-vis diffuse reflectance spectroscopy; film with thickness of 50 nm" "" "Hexagonal" "" "1.63" "0" "845" "UV-vis diffuse reflectance spectroscopy; film with thickness of 10 nm" "" "Hexagonal" "" "1.64" "0" "845" "UV-vis diffuse reflectance spectroscopy; film with thickness of 2.5 nm" "" "Hexagonal" "" "1.27" "0" "45" "T > 300 K" "" "" "2H" "0.25" "0" "45" "" "0" "" "3R"

Chart

X axis: Y axis:

CSV Viewer: MoS2

Eg IsCalculated ReferenceId Comment Temperature CrystalSystem Modification
0.47 0 45 T < 300 K
0.7 0 45
1.4 0 45
1.6 0 45
1.9 0 45
1.971 0 45 77
1 0 37 300
1.2 0 30 300
1.5 0 845 UV-vis diffuse reflectance spectroscopy; film with thickness of 50 nm Hexagonal
1.63 0 845 UV-vis diffuse reflectance spectroscopy; film with thickness of 10 nm Hexagonal
1.64 0 845 UV-vis diffuse reflectance spectroscopy; film with thickness of 2.5 nm Hexagonal
1.27 0 45 T > 300 K 2H
0.25 0 45 0 3R