BaHfN2
Type: Volume Composition show more
ObjectId: 6501 ExternalId: 5602
Created: 2/1/2023 3:33:28 PM by Vic) Dudarev Victor [vic_dudarev@mail.ru]
Access: Public Sort Code (asc): 0
Description: BaHfN2
[no file attached]
: Ba-Hf-N
Composition
| Element | Absolute | Percentage | |
|---|---|---|---|
| Ba | 1 | 25 % | |
| Hf | 1 | 25 % | |
| N | 2 | 50 % |
Associated Objects
-
Shiraishi A.,Kimura S.,He X.,Watanabe N.,Katase T.,Ide K.,Minohara M.,
Literature ReferenceShiraishi A.,Kimura S.,He X.,Watanabe N.,Katase T.,Ide K.,Minohara M.,Matsuzaki K.,Hiramatsu H.,Kumigashira H.,Hosono H.,Kamiya T. Design, Synthesis, and Optoelectronic Properties of the High-Purity Phase in Layered AETMN2 (AE = Sr, Ba; TM = Ti, Zr, Hf) Se
All properties (except table)
No properties found
The table
| CrystalSystem | StructureType | SpaceGroup | Eg | IsCalculated | ReferenceId | Comment | Temperature |
|---|---|---|---|---|---|---|---|
| Tetragonal | KCoO2 | P4/nmm | 2.28 | 1 | 1793 | Indirect. Calculation. VASP | |
| Tetragonal | KCoO2 | P4/nmm | 2.4 | 1 | 1793 | Direct. Calculation. VASP | |
| Tetragonal | KCoO2 | P4/nmm | 2.17 | 0 | 1793 | Indirect. Diffuse reflectance spectroscopy | 298 |
| Tetragonal | KCoO2 | P4/nmm | 2.18 | 0 | 1793 | Direct. Diffuse reflectance spectroscopy | 298 |