Ji R.,Lei M.,Genevois C.,Zhang W.,Ming X.,He L.,Allix M.,Yin C.,Kuang

Type: Literature Reference

ObjectId: 1821 ExternalId: 1796

Created: 2/1/2023 3:32:34 PM by Vic) Dudarev Victor [vic_dudarev@mail.ru]

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Description: Ji R.,Lei M.,Genevois C.,Zhang W.,Ming X.,He L.,Allix M.,Yin C.,Kuang X.,Xing X. Multiple Anion Chemistry for Ionic Layer Thickness Tailoring in Bi2+2nO2+2nSenX2 (X = Cl, Br) van der Waals Semiconductors with Low Thermal Conductivities

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ReferenceId: 1821

Authors list (comma-separated): Ji R.,Lei M.,Genevois C.,Zhang W.,Ming X.,He L.,Allix M.,Yin C.,Kuang X.,Xing X.

Title: Multiple Anion Chemistry for Ionic Layer Thickness Tailoring in Bi2+2nO2+2nSenX2 (X = Cl, Br) van der Waals Semiconductors with Low Thermal Conductivities

Journal: Chem.Mater.

Year: 2022

Volume: v.33

Number (issue): N.10

Start Page: p.4751

End Page: 4764

DOI: 10.1021/acs.chemmater.2c00786

URL:

BibTeX :

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