MoS₂

Type: Volume Composition show more

ObjectId: 4592 ExternalId: 3501

Created: 2/1/2023 3:33:16 PM by PowerUser1 [PowerUser1@user.org]

Access: Public Sort Code (asc): 0

Description: MoS₂

[no file attached]

Chemical System: Mo-S

Element	Absolute		Percentage
Mo	1		33.333 %
S	2		66.667 %

Crystal Chemical, Physical-Chemical and Physical Properties of Semicon
Literature Reference
Crystal Chemical, Physical-Chemical and Physical Properties of Semiconducting Substances. Handbook. Standard Publ., Moscow
Landolt-Bornstein. Numerical Data and Functional Relationships in Scie5
Literature Reference
Landolt-Bornstein. Numerical Data and Functional Relationships in Science and Technology. New Ser. Group III: Crystal and Solid State Physics. V.17. Semiconductors. Subv.g: Physics of Non-Tetrahedrally Bonded Elements and Binary Compounds III. Springer-Ver
Physical Properties. Handbook. Ed. By I.S.Grigor'ev&E.Z.Meilikhov. Mos
Literature Reference
Physical Properties. Handbook. Ed. By I.S.Grigor'ev&E.Z.Meilikhov. Moscow, Energoatomizdat
Zhu J.,Wu J.,Sun Y.,Huang J.,Xia Y.,Wang H.,Wang H.,Wang Y.,Yi Q.,Zou
Literature Reference
Zhu J.,Wu J.,Sun Y.,Huang J.,Xia Y.,Wang H.,Wang H.,Wang Y.,Yi Q.,Zou G. Thickness-dependent bandgap tunable molybdenum disulfide films for optoelectronics

No properties found

E_g	ReferenceId	Comment	Temperature	CrystalSystem	Modification
0.47	45	T < 300 K
0.7	45
1.4	45
1.6	45
1.9	45
1.971	45		77
1	37		300
1.2	30		300
1.5	845	UV-vis diffuse reflectance spectroscopy; film with thickness of 50 nm		Hexagonal
1.63	845	UV-vis diffuse reflectance spectroscopy; film with thickness of 10 nm		Hexagonal
1.64	845	UV-vis diffuse reflectance spectroscopy; film with thickness of 2.5 nm		Hexagonal
1.27	45	T > 300 K			2H
0.25	45		0		3R

MoS2